Thermal Interface Resistance Measurements for GaN-on-Diamond Composite Substrates
Cho, J., Won, Y., Francis, D., Asheghi, M., and Goodson, K.E., “Thermal Interface Resistance Measurements for GaN-on-Diamond Composite Substrates,” IEEE Compound Semiconductor Integrated Circuit Symposium (CSICS) 2014, Oct. 19-22, La Jolla, CA, USA.