Phase and Temperature Dependent Thermoelectric Properties of Ge2Sb2Te5 Films down to 25 nm Thickness
Lee, J., Kodama, T., Won, Y., Asheghi, M., and Goodson, K.E., 2012, “Phase and Temperature Dependent Thermoelectric Properties of Ge2Sb2Te5 Films down to 25 nm Thickness,” Journal of Applied Physics, Vol. 112, 014902.