Thermal Mapping of Interconnects Subjected to Brief Electrical Stresses,
Ju, Y.S., and Goodson, K.E., 1997, “Thermal Mapping of Interconnects Subjected to Brief Electrical Stresses,” IEEE Electron Device Letters, Vol. 18, pp. 512-514.
Impact of Nucleation Density on Thermal Resistance Near Diamond-Substrate Boundaries
Touzelbaev, M.N., and Goodson K.E., 1997, “Impact of Nucleation Density on Thermal Resistance Near Diamond-Substrate Boundaries,” AIAA Journal of Thermophysics and Heat Transfer, Vol. 11, pp. 506-512.
Thermal Conduction in Nonhomogeneous CVD Diamond Layers in Electronic Microstructures
Goodson, K.E., 1996, “Thermal Conduction in Nonhomogeneous CVD Diamond Layers in Electronic Microstructures,” ASME Journal of Heat Transfer, Vol. 118, pp. 279-286.
Prediction and Measurement of Temperature Fields in Silicon-on-Insulator Electronic Circuits
Goodson, K.E., Flik, M.I., Su, L.T., and Antoniadis, D.A., 1995, “Prediction and Measurement of Temperature Fields in Silicon-on-Insulator Electronic Circuits,” ASME Journal of Heat Transfer, Vol. 117, pp. 574-581.
Experimental Investigation of Thermal Conduction normal to Diamond-Silicon Boundaries
Goodson, K.E., Kading, O.W., Rosler, M. and Zachai, R., 1995, “Experimental Investigation of Thermal Conduction normal to Diamond-Silicon Boundaries,” Journal of Applied Physics, Vol. 77, pp. 1385-1392.
Thermal Conduction normal to Diamond-Silicon Boundaries
Goodson, K.E., Kading, O.W., Rosler, M. and Zachai, R., 1995, “Thermal Conduction normal to Diamond-Silicon Boundaries,” Applied Physics Letters, Vol. 66, pp. 3134-3136.
Prediction and Measurement of the Thermal Conductivity of Amorphous Dielectric Layers
Goodson, K.E., Flik, M.I., Su, L.T., and Antoniadis, D.A., 1994, “Prediction and Measurement of the Thermal Conductivity of Amorphous Dielectric Layers,” ASME Journal of Heat Transfer, Vol. 116, pp. 317-324.
Thermal Conduction Processes with Sub-Micrometer Lengthscales in Electronic Circuits
Goodson, K.E., and Flik, M.I., 1994, "Thermal Conduction Processes with Sub-Micrometer Lengthscales in Electronic Circuits," Thermal Science and Engineering, Vol. 2, pp. 191-201.
Measurement and Modeling of Self-Heating in SOI nMOSFETS
Su, L.T., Chung, J.E., Antoniadis, D.A., Goodson, K.E., and Flik, M.I., 1994, “Measurement and Modeling of Self-Heating in SOI nMOSFETS,” IEEE Transactions on Electron Devices, Vol. 41, pp. 69-75.
Thermal Conduction in Metallized Silicon-Dioxide Layers on Silicon
Kading, O.W., Skurk, H., and Goodson, K.E., 1994, “Thermal Conduction in Metallized Silicon-Dioxide Layers on Silicon,” Applied Physics Letters, Vol. 65, pp. 1629-1631.